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Diad V
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<blockquote data-quote="brownracer" data-source="post: 356908" data-attributes="member: 304"><p>The next generation DIAD devices are undergoing testing from many viewpoints. Driver and management feedback is being collected from several sources. At this stage of the testing the devices themselves are not being selected, but rather which features of a proposed device are liked/disliked-- such as toggle, signature key location, order of keys, key spacing, size of keys, size of device, etc. That is why the test is called a "form factor test." Please feel free to continue to comment on what everyone would like to see, or not see, in the next DIAD-- people are listening to you.</p></blockquote><p></p>
[QUOTE="brownracer, post: 356908, member: 304"] The next generation DIAD devices are undergoing testing from many viewpoints. Driver and management feedback is being collected from several sources. At this stage of the testing the devices themselves are not being selected, but rather which features of a proposed device are liked/disliked-- such as toggle, signature key location, order of keys, key spacing, size of keys, size of device, etc. That is why the test is called a "form factor test." Please feel free to continue to comment on what everyone would like to see, or not see, in the next DIAD-- people are listening to you. [/QUOTE]
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